The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2026
Filed:
Jan. 14, 2025
Applicant:
Vuette Pte. Ltd., Singapore, SG;
Inventors:
Assignee:
VUETTE PTE. LTD., Singapore, SG;
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/04 (2006.01); G01R 1/073 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2867 (2013.01); G01R 1/0491 (2013.01); G01R 1/07342 (2013.01);
Abstract
A wafer tester and a storage container for the wafer tester are provided. The wafer tester includes a chuck, a probe card, a storage container, and a conveying device. The probe card is disposed above the chuck with respect to the chuck. The storage container includes a plurality of drawers, and the plurality of drawers are configured for carrying the test sample or an auxiliary device. The conveying device conveys the test sample or the auxiliary device among the chuck, the storage container, and the wafer cassette.
Lou, Choon. (2026). Wafer tester and storage container for wafer tester (U.S. Patent No. 12761269). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12761269
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile