The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2026
Filed:
Aug. 23, 2024
Keysight Technologies, Inc., Santa Rosa, CA (US);
David Leyba, Santa Rosa, CA (US);
KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);
Abstract
A test system implemented method is for measuring the noise margin of a repeating signal under test (SUT). The method includes determining a digitizer noise of a digitizer channel of the test system, and applying the repeating SUT to the digitizer channel of the test system. An oversampled equivalent-time waveform representation of the repeating SUT is acquired, and then a filtered waveform representation is obtained. A noise margin om of the repeating SUT is determine in accordance with the equation σ=(σ+σ−σ), where σis a standard deviation of a maximum amount of gaussian noise that can added to the filtered waveform representation without its symbol error rate (SER) exceeding a target value, σis a standard deviation of the digitizer noise, and σis a standard deviation of the noise components removed to obtain the filter waveform representation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile