The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Dec. 08, 2022
Applicant:

Miliwave Co., Ltd., Gangwon-do, KR;

Inventors:

Seung Hyun Rha, Gyeonggi-do, KR;

Yung Ha Han, Seoul, KR;

Ho Sun Lee, Gyeonggi-do, KR;

Assignee:

MILIWAVE CO., LTD., Gangwon-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0871 (2013.01);
Abstract

Disclosed is an RF characteristic measurement system comprising: a shield box in which a DUT accessing a network on mobile by using an access point antenna and an antenna module is provided, which receives an RF signal of the AP antenna; a test device for generating the RF signal to be transmitted to the DUT, and measuring the RF characteristic of the DUT by using an RF characteristic signal received from the DUT; and a control device for controlling the operation of the DUT and the operation of the test device, wherein the test device includes: an attenuator for adjusting the output power of the RF signal to be input into the DUT; a transmission/reception path separator, which is electrically connected to the AP antenna and separates transmitted/received RF signals from each other; and an AP board, which is electrically connected to the attenuator and the transmission/reception path separator.


Find Patent Forward Citations

Rha, Seung. (2026). Rf characteristic measurement method and system (U.S. Patent No. 12761257). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12761257

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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