The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2026
Filed:
Oct. 12, 2023
Illinois Tool Works Inc., Glenview, IL (US);
Glen Charles Grenier, Ray, MI (US);
Maureen Bitney, Minnetonka, MN (US);
ILLINOIS TOOL WORKS INC., Glenview, IL (US);
Abstract
A method used in a system allows an operator to use pre-qualified reference data to determine limits in the same statistical domain for one or more outputs, which can be used to qualify reference data for use during a test. With this method, each drive is applied to the system where a controller receives the data. The controller automatically scrutinizes the data received comparing each output received to its associated set of acceptable limits. If one or more of the limits are violated, the output(s) will be identified to the operator and the received data will be disqualified or otherwise not used. When received response data does indeed meet all limits, the data can be considered qualified reference data that is then used during testing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile