The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Jun. 23, 2022
Applicant:

Smiths Detection France S.a.s., Vitry sur Seine, FR;

Inventors:

Jean-Michel Faugier, Vitry-sur-Seine, FR;

Thibaut Berthelier, Vitry-sur-Seine, FR;

Assignee:

SMITHS DETECTION FRANCE S.A.S., Vitry-sur-Seine, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2018.01); G01N 23/083 (2018.01); G01N 23/10 (2018.01);
U.S. Cl.
CPC ...
G01N 23/04 (2013.01); G01N 23/083 (2013.01); G01N 23/10 (2013.01); G01N 2223/3303 (2013.01); G01N 2223/401 (2013.01);
Abstract

In one embodiment it is disclosed an x-ray inspection system including: a plurality of detector elements for detecting x-rays, the detector elements being positioned to detect x-rays from an inspection area; a control logic module, separate from the detector elements, the control logic module being configured to control operation of the detector elements and an x-ray source for the acquisition of x-ray inspection data, and to synchronise operation of the detector elements with operation of the x-ray source.


Find Patent Forward Citations

Quick Actions:

Faugier, Jean-Michel. (2026). X-ray inspection system and control architecture for an x-ray inspection system (U.S. Patent No. 12761163). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12761163

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