The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2026
Filed:
Apr. 27, 2023
Nanjing University of Science and Technology, Nanjing, CN;
Chao Zuo, Nanjing, CN;
Qian Chen, Nanjing, CN;
Jiasong Sun, Nanjing, CN;
Shijie Feng, Nanjing, CN;
Xuejuan Wu, Nanjing, CN;
Yao Fan, Nanjing, CN;
Linpeng Lu, Nanjing, CN;
Yuzhen Zhang, Nanjing, CN;
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY, Nanjing, CN;
Abstract
The invention presents a lensless Fourier ptychographic diffraction tomography microscopy imaging method based on wavelength scanning. The technique uses only a wavelength-tunable light source for illumination on a lensless microscope experimental system to collect a series of coaxial holograms. Then, the three-dimensional scattering potential spectrum is filled using an iterative Fourier ptychographic method to restore the three-dimensional refractive index distribution of the sample directly. The present invention does not require complex modifications to traditional lensless on-chip microscopes. It can endow lensless on-chip microscopes with the ability of pixel super-resolution three-dimensional tomographic imaging.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile