The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2026
Filed:
Dec. 20, 2024
Industrial Technology Research Institute, Hsinchu, TW;
Chang Huang, New Taipei City, TW;
Ming-An Chen, Taipei City, TW;
Guan-Yu Zhu, Taoyuan City, TW;
Hsing-Wei Huang, Hsinchu City, TW;
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE, Hsinchu, TW;
Abstract
An optical phase analyzing system and an optical phase analyzing method are provided. The optical phase analyzing system includes a light source assembly, an optical phase measuring device, and a processing device. The optical phase measuring device includes a polarizing beam splitter group, an interfering polarizer group, and a polarizing image pickup device. The polarizing beam splitter group is configured to split polarized light into a reference beam and a measurement beam which have a polarization angle difference of 90 degrees, and the measurement beam passes through a meta lens to undergo measurement, such that a phase analysis beam is formed. The interfering polarizer group is configured to cause the reference beam and the phase analysis beam to interfere and circularly polarize to form a circularly polarized beam. The polarizing image pickup device is configured to obtain a meta lens phase according to an unprocessed image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile