The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2026
Filed:
Jan. 24, 2023
Carl Zeiss Meditec Ag, Jena, DE;
Felicia Walz, Schwäbisch Gmünd, DE;
Dominik Scherer, Aalen, DE;
Stefan Saur, Aalen, DE;
Marco Woerner, Gerstetten, DE;
Lars Stoppe, Jena, DE;
Christian Platt, Ulm, DE;
CARL ZEISS MEDITEC AG, Jena, DE;
Abstract
The invention relates to a method for operating a medical microscope, in particular in the field, with an interchange and/or a misalignment of at least one component of the medical microscope being followed by an identification of the interchanged and/or misaligned at least one component, with required adjustment measures and/or calibration measures being determined in automated fashion using the identified at least one interchanged and/or misaligned component as a starting point, and with the determined required adjustment measures and/or calibration measures being carried out. Furthermore, the invention relates to a medical microscope arrangement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile