The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 2026
Filed:
Feb. 12, 2024
Max-planck-gesellschaft Zur Förderung Der Wissenschaften E.v., Munich, DE;
Dmitry Zimin, Cambridge, GB;
Ferenc Krausz, Garching, DE;
Abstract
A method for photonic sampling of a test-waveform is provided. The method includes providing a sampling light pulse and generating a local oscillator by frequency multiplication of the sampling light pulse. The method further includes generating a signal wave by frequency mixing of the sampling light pulse and the test-waveform in a nonlinear optical element, wherein the frequency multiplication of the sampling light pulse and the frequency mixing of the sampling light pulse and the test-waveform are selected such that the local oscillator and the signal wave are at least partly spectrally overlapping. Moreover, the method includes detecting an interference signal of the local oscillator and the signal wave for various time delays of the sampling light pulse with respect to the test-waveform. A device for sampling a test-waveform is also disclosed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile