The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Apr. 19, 2023
Applicant:

Vega Grieshaber KG, Wolfach, DE;

Inventors:

Christian Hoferer, Offenburg, DE;

René Herrmann, Oberwolfach, DE;

Manuel Kaufmann, Berghaupten, DE;

Martin Gaiser, Alpirsbach, DE;

Joachim Benz, Hausach, DE;

Assignee:

VEGA Grieshaber KG, Wolfach, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01F 23/2962 (2022.01); G01F 23/284 (2006.01); G01F 23/80 (2022.01);
U.S. Cl.
CPC ...
G01F 23/2962 (2013.01); G01F 23/284 (2013.01); G01F 23/804 (2022.01);
Abstract

A level-measuring device, for determining a level of a medium is described, with an evaluation unit, that generates a measuring signal for determining the level based on a digitally converted signal of a reflected signal emitted from the level-measuring device toward the medium, wherein the level is determined based on a characteristic feature of the measuring signal; and that monitors, by way of a monitoring function, the determination of the level based on the characteristic feature and wherein the monitoring function selectively has at least one of a higher quality level and a lower quality level to the determination of the level.


Find Patent Forward Citations

Hoferer, Christian. (2026). Level-measuring device with selectable quality level of a monitoring function (U.S. Patent No. 12761063). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12761063

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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