The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Aug. 16, 2021
Applicant:

Ntt, Inc., Tokyo, JP;

Inventors:

Tatsuya Okamoto, Musashino, JP;

Daisuke Iida, Musashino, JP;

Yusuke Koshikiya, Musashino, JP;

Nazuki Honda, Musashino, JP;

Assignee:

NTT, Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/353 (2006.01);
U.S. Cl.
CPC ...
G01D 5/35361 (2013.01);
Abstract

An object of the present invention is to provide a sensing system, a sensing method, and an analyzing device using OFDR in which a sensing range of strain/temperature is less likely to be limited by a frequency sweep width. In the sensing method using OFDR, the sensing system according to the present invention employs sequential update, per measurement by one frequency sweep of the probe light, for setting the reference spectrum to the spectrum of an immediately preceding measurement, by which a spectral shift between an n-th measurement and an (n−1)th measurement is obtained, and the spectral shifts individually obtained between the measurements are integrated.


Find Patent Forward Citations

Okamoto, Tatsuya. (2026). Sensing system, sensing method, and analyzer (U.S. Patent No. 12761052). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12761052

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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