The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Mar. 29, 2022
Applicant:

Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);

Inventors:

Andrew N. Acker, Honolulu, HI (US);

Eric M. Louchard, Miami, FL (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
F41H 11/13 (2011.01); G06T 7/70 (2017.01); G06V 20/17 (2022.01); G06V 20/60 (2022.01);
U.S. Cl.
CPC ...
F41H 11/13 (2013.01); G06T 7/70 (2017.01); G06V 20/17 (2022.01); G06V 20/60 (2022.01); G06T 2207/10036 (2013.01); G06V 2201/07 (2022.01);
Abstract

Predicting whether objects in an image form a scattered minefield (SMF) is accomplished by a system and method utilizing at least one non-transitory computer readable storage medium having instructions stored thereon. When the instructions are executed by a processor, the instructions implement operations to determine whether the objects define a SMF based on an estimation of a distribution process from which the MLOs are positioned on the surface in the image obtained from the image sensor.


Find Patent Forward Citations

Acker, Andrew. (2026). System and method for detecting a scattered minefield (U.S. Patent No. 12761003). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12761003

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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