The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Sep. 16, 2022
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventor:

Shutian Yuan, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B60C 23/04 (2006.01);
U.S. Cl.
CPC ...
B60C 23/0486 (2013.01); B60C 23/0408 (2013.01);
Abstract

A tire parameter monitoring apparatus, method, and system are provided. The apparatus includes a receiver, a processor, and an output circuit. The receiver may be configured to receive an excitation signal. The processor may be configured to obtain resonance frequency information of a tire, wherein the resonance frequency information of the tire is related to a monitoring parameter of the tire. The output circuit may be configured to reflect an output signal in response to the excitation signal. The output parameter of the output signal is obtained based on the resonance frequency information of the tire, and the output signal is used to obtain the monitoring parameter of the tire based on the output parameter of the output signal.


Find Patent Forward Citations

Yuan, Shutian. (2026). Tire parameter monitoring apparatus, method, and system (U.S. Patent No. 12759350). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12759350

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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