The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Oct. 29, 2020
Applicants:

Sorbonne Université, Paris, FR;

Centre National DE LA Recherche Scientifique, Paris, FR;

Inventors:

Sinan Haliyo, Paris, FR;

Stéphane Régnier, Paris, FR;

Edison Gerena, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/064 (2014.01);
U.S. Cl.
CPC ...
B23K 26/0643 (2013.01);
Abstract

The present invention relates to a device (IO) for controlling the axial position of a laser focal point produced by a microscope objective, comprising:—a laser source for emitting a laser beam,—a deformable mirror for focusing or defocusing the laser beam axially,—a microscope objective for focusing the laser beam coming from the deformable mirror on a laser focal point, characterized in that it further comprises a system for passing the laser beam emitted by the laser source several times through the deformable mirror.


Find Patent Forward Citations

Haliyo, Sinan. (2026). Device for controlling the axial position of a laser focal point produced by a microscope objective (U.S. Patent No. 12759075). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12759075

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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