The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

May. 17, 2024
Applicant:

J. Morita Mfg. Corp., Kyoto, JP;

Inventors:

Tsuyoshi Tanaka, Kyoto, JP;

Takuya Okada, Kyoto, JP;

Takeshi Hayashi, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61C 9/00 (2006.01);
U.S. Cl.
CPC ...
A61C 9/0053 (2013.01);
Abstract

A three-dimensional scanner includes imaging circuitry configured to take an image of an object located at a focal position of a lens, a lens driver configured to drive the lens to make reciprocating motion in a linear direction, an angle detector configured to detect variation in angle of inclination of the lens with respect to a prescribed direction, and processing circuitry configured to control an operation of the lens in accordance with the variation in angle of inclination detected by the angle detector.


Find Patent Forward Citations

Tanaka, Tsuyoshi. (2026). Three-dimensional scanner and control method (U.S. Patent No. 12758368). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12758368

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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