The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

Feb. 18, 2022
Applicant:

Osaka University, Osaka, JP;

Inventor:

Yoshie Sugiyama, Osaka, JP;

Assignee:

OSAKA UNIVERSITY, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2024.01); A61B 6/50 (2024.01); A61B 5/055 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5217 (2013.01); A61B 6/504 (2013.01); A61B 5/055 (2013.01);
Abstract

A wall thickness estimation method includes: obtaining behavioral information based on a video in which an organ wall or a blood vessel wall is captured using four-dimensional angiography, the behavioral information being numerical information about changes over time in a position of each of a plurality of predetermined points in the organ wall or the blood vessel wall; generating, based on the behavioral information obtained in the obtaining, estimation information that visualizes a strain of each of the plurality of predetermined points for estimating a thickness of the organ wall or a thickness of the blood vessel wall; and outputting the estimation information generated in the generating.


Find Patent Forward Citations

Sugiyama, Yoshie. (2026). Wall thickness estimation method, recording medium, wall thickness estimation device, and wall thickness estimation system (U.S. Patent No. 12758175). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12758175

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