The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2026
Filed:
Oct. 22, 2021
Apple Inc., Cupertino, CA (US);
Jie Cui, San Jose, CA (US);
Dawei Zhang, Saratoga, CA (US);
Hong He, San Jose, CA (US);
Huaning Niu, San Jose, CA (US);
Manasa Raghavan, Sunnyvale, CA (US);
Qiming Li, Beijing, CN;
Xiang Chen, Campbell, CA (US);
Yang Tang, San Jose, CA (US);
APPLE INC., Cupertino, CA (US);
Abstract
Serving cell measurements at a reduced capability UE in idle mode in FR1 includes identifying an eDRX cycle length associated with the reduced capability UE is longer than or equal to 20.48 s and shorter than or equal to 10, 485.76 s. The eDRX cycle length includes a DRX cycle length. A measurement period associated with a serving cell of the reduced capability UE is determined to occur within a single PTW of the eDRX cycle. The measurement period includes measurement samples to be performed within the single PTW. A length of the single PTW is determined based on a product of the DRX cycle length and a sample scaling factor associated with the measurement samples. The length of the single PTW comprises a multiple of 1.28. Serving cell measurements are performed during the single PTW. The serving cell measurements include each of the measurement samples associated with the measurement period.