The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Jan. 06, 2022
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Jie Cui, San Jose, CA (US);

Yang Tang, San Jose, CA (US);

Qiming Li, Beijing, CN;

Manasa Raghavan, Sunnyvale, CA (US);

Xiang Chen, Campbell, CA (US);

Huaning Niu, San Jose, CA (US);

Dawei Zhang, Saratoga, CA (US);

Hong He, Cupertino, CA (US);

Yushu Zhang, Beijing, CN;

Haitong Sun, Cupertino, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04W 74/0808 (2024.01); H04W 74/08 (2024.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04W 74/0808 (2013.01);
Abstract

This disclosure relates to techniques for performing inter radio access technology measurements without a measurement gap in a wireless communication system. A wireless device and a cellular base station may establish a wireless link according to a first radio access technology. The cellular base station may indicate to the wireless device to perform inter radio access technology measurements. The wireless device may determine that it is capable of performing the inter radio access technology measurements without a measurement gap. The wireless device may provide capability information to the cellular base station indicating that the wireless device is capable of performing the inter radio access technology measurements without a measurement gap. The wireless device may perform the inter radio access technology measurements without a measurement gap.


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