The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Nov. 15, 2021
Applicant:

Beijing Xiaomi Mobile Software Co., Ltd., Beijing, CN;

Inventor:

Liangang Chi, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04L 5/00 (2006.01); H04W 36/08 (2009.01); H04W 76/20 (2018.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04L 5/0051 (2013.01); H04W 36/08 (2013.01); H04W 76/20 (2018.02);
Abstract

A method for measuring a beam is performed by a User Equipment (UE). The method includes: obtaining configuration information sent by a base station; obtaining, based on the configuration information, at least one reference signal sent by the base station, determining a class value corresponding to the at least one reference signal, and performing beam measurement for the at least one reference signal to obtain a measurement result, wherein the class value is correlated with a beam bandwidth of the reference signal; and determining, based on at least one of the measurement result of the reference signal or the configuration information, a class value of an anchor reference signal, and performing at least one of the beam measurement or data reporting by anchoring on an anchor reference signal corresponding to the class value of the anchor reference signal.


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