The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Dec. 19, 2023
Applicant:

Mediatek Singapore Pte. Ltd., Singapore, SG;

Inventors:

Rama Kiran, Bengaluru KA, IN;

Chandrasekaran Mohandoss, Bengaluru KA, IN;

Jinesh Parameshwaran Nair, Bengaluru KA, IN;

Chien-Hua Chen, Hsinchu, TW;

Yih-Shen Chen, Hsinchu, TW;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01); H04L 5/14 (2006.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01); H04L 5/14 (2013.01);
Abstract

In an aspect of the disclosure, a method, a computer-readable medium, and an apparatus are provided. The apparatus is a UE. The UE receives, from a base station, a measurement configuration for measuring cross-link interference (CLI) in a subband full-duplexing (SBFD) slot and a reporting configuration for reporting the CLI. The UE performs measurements of the CLI on measurement resources indicated by the measurement configuration. The UE reports an indication of the measured CLI to the base station according to the reporting configuration.


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