The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Oct. 02, 2020
Applicant:

Ntt, Inc., Tokyo, JP;

Inventor:

Hiroshi Kurakami, Musashino, JP;

Assignee:

NTT, Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 43/0876 (2022.01); H04L 9/40 (2022.01);
U.S. Cl.
CPC ...
H04L 43/0876 (2013.01); H04L 63/1433 (2013.01);
Abstract

A test device includes processing circuitry configured to access a test target site managed by a test target device to acquire information on the test target site, and specify test settings for increasing a processing load of the test target device based on the information, manage session information of a test packet for increasing a processing load on the test target device, construct a test session with the test target device according to a scenario based on the test settings specified, and generate the test packet, and transmit the test packet for increasing the processing load to the test target device.


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