The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Nov. 27, 2024
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Young Chang Kim, Daejeon, KR;

Jin Tae Oh, Daejeon, KR;

Jong Choul Yim, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 9/32 (2006.01);
U.S. Cl.
CPC ...
H04L 9/3236 (2013.01);
Abstract

A method and an apparatus for generating a consensus are disclosed. According to an embodiment of a present disclosure, a method for generating a consensus includes calculating hash values using a header value of a block and a node list. The method also includes generating a candidate consensus by comparing the hash values with a threshold value. The method also includes generating a sorted candidate consensus by sorting node information in the candidate consensus. The method also includes generating a final consensus by selecting node information in the sorted candidate consensus as many as a consensus quorum based on a number of voting rights of each node. The node information is information on a node ID and a hash value pair.


Find Patent Forward Citations

Kim, Young. (2026). Method and apparatus for generating consensus for enduring node failure (U.S. Patent No. 12756573). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12756573

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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