The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Sep. 08, 2021
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Kazuki Namba, Tokyo, JP;

Masato Utsumi, Tokyo, JP;

Tohru Watanabe, Tokyo, JP;

Ikuo Shigemori, Tokyo, JP;

Hiroshi Iimura, Tokyo, JP;

Daisuke Hamaba, Tokyo, JP;

Dan Zhao, Tokyo, JP;

Hiroaki Ogawa, Tokyo, JP;

Jun Yamazaki, Tokyo, JP;

Assignee:

HITACHI, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02J 3/17 (2026.01); H02J 3/00 (2006.01);
U.S. Cl.
CPC ...
H02J 3/17 (2026.01); H02J 3/003 (2020.01);
Abstract

A system generates a first tree structure representing a relation of a plurality of measurement data sets, and generates goodness-of-fit data based on at least a part of attribute data regarding one or more branch portions included in the first tree structure. The attribute data includes one or more attribute values at one or more points in time regarding each of one or more attribute items. The goodness-of-fit data includes goodness-of-fit for each attribute item regarding each branch portion. With regard to each attribute item for each branch portion, goodness-of-fit is a value calculated based on a parent node and two or more child nodes belonging to the relevant branch portion, and one or more attribute values corresponding to the relevant attribute item, and represents a degree that the relevant attribute item will fit as a base of a branch condition. The system generates a second tree structure in which a branch condition decided based on the goodness-of-fit data is associated with a branch portion included in the first tree structure, and performs data estimation using the second tree structure.


Find Patent Forward Citations

Namba, Kazuki. (2026). Data analysis system and method (U.S. Patent No. 12756194). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12756194

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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