The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

May. 24, 2024
Applicant:

Toyota Jidosha Kabushiki Kaisha, Toyota, JP;

Inventors:

Kazuho Saeki, Yokohama, JP;

Hanae Shiratori, Gotenba, JP;

Masao Yano, Suntou-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/74 (2022.01); G01N 23/201 (2018.01); G06F 17/16 (2006.01); G06T 7/00 (2017.01); G06T 7/40 (2017.01); G06T 11/00 (2026.01); G06V 10/42 (2022.01); G06V 10/44 (2022.01); G06V 10/77 (2022.01);
U.S. Cl.
CPC ...
G06V 10/761 (2022.01); G06T 7/00 (2013.01); G06T 7/40 (2013.01); G06V 10/44 (2022.01); G01N 23/201 (2013.01); G01N 2223/054 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/41 (2013.01); G06F 17/16 (2013.01); G06T 7/0004 (2013.01); G06T 11/00 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/20056 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/30108 (2013.01); G06T 2207/30156 (2013.01); G06V 10/431 (2022.01); G06V 10/7715 (2022.01);
Abstract

For easy visualization of features of an image representing a structure of a material, an image analyzer includes a transformer that performs a Fourier transform on each of a plurality of original images representing a structure of a material and acquires a plurality of power spectra; an analyzer that performs principal component analysis on the plurality of power spectra and acquires principal components and principal component scores; and a reconstructor that reconstructs an image based on the principal components and principal component scores and outputs a feature image representing features of the original image. The reconstructor generates a difference image based on a reconstructed changed image obtained by changing one or more of the principal component scores and a reference image, and outputs the generated difference image as the feature image. The principal component score to be changed may be determined using a trained regression/classification model constructed by machine learning.


Find Patent Forward Citations

Saeki, Kazuho. (2026). Image analyzer for material structure using fourier transform and principal component analysis (U.S. Patent No. 12755511). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12755511

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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