The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Apr. 09, 2024
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Yusuke Maeda, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06F 3/14 (2006.01); G06V 30/19 (2022.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06F 3/14 (2013.01); G06V 30/19093 (2022.01); G06T 2207/30144 (2013.01);
Abstract

An inspection apparatus performs a process depending on a type of each of blocks extracted from a reference image to be used for inspection settings in a case of inspecting a printed sheet, and obtains a character string and coordinates indicating a position of the character string for each block. The inspection apparatus compares the character string obtained from the reference image with a correct character string to determine the character string which is corresponding to the correct character string and is obtained from the reference image, and associates the coordinates indicating the position of the character string determined as the corresponding character string with the correct character string. The inspection apparatus makes a setting regarding an inspection area to be inspected in the printed sheet based on the coordinates associated with the correct character string.


Find Patent Forward Citations

Maeda, Yusuke. (2026). Inspection apparatus, method of controlling inspection apparatus, and storage medium (U.S. Patent No. 12755372). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12755372

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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