The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Sep. 04, 2024
Applicant:

Siemens Healthineers Ag, Forchheim, DE;

Inventors:

Maximilian Rohleder, Erlangen, DE;

Björn Kreher, Bräuningshof, DE;

Holger Kunze, Bubenreuth, DE;

Gerhard Kleinszig, Forchheim, DE;

Assignee:

Siemens Healthineers AG, Forchheim, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
G06T 7/00 (2013.01); A61B 2090/376 (2016.02); G06T 2207/10116 (2013.01);
Abstract

A method for monitoring a surgical intervention with X-ray imaging by way of a recording system that is adjustable into different angulations includes recording a first projection image of an implant in a first angulation and, following a forward movement of the implant, recording a third projection image of the implant in a third angulation. The method further includes establishing the original position of the tip of the implant in the first projection image, establishing the advanced position of the tip of the implant in the third projection image, establishing a first epipolar line for the advanced position of the tip in the first projection image by the epipolar geometry determined by way of the first and the third angulation, and simultaneously displaying the first and the third projection images, wherein the established epipolar line is shown in the first projection image.


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