The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Sep. 17, 2024
Applicant:

Raytheon Company, Tewksbury, MA (US);

Inventors:

Yu Wang, Tucson, AZ (US);

Dave S. Douglas, Marana, AZ (US);

Jonathan Aaron Cain, Tucson, AZ (US);

Mark S. Smith, Tucson, AZ (US);

Patrick O. Kano, Tucson, AZ (US);

Assignee:

Raytheon Company, Arlington, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/70 (2024.01); G06T 3/40 (2006.01);
U.S. Cl.
CPC ...
G06T 5/70 (2024.01); G06T 3/40 (2013.01); G06T 2207/20172 (2013.01);
Abstract

A method for providing enhanced subpixel resolution includes obtaining point spread function (PSF) data associated with an input image. The method also includes determining subpixel PSF data from the PSF data. The method further includes generating a filled subpixel sparse image from pixels of the input image. In addition, the method includes applying nearest neighbor pixel deconvolution (NNPD) to the subpixel PSF data and the filled subpixel sparse image to generate an enhanced subpixel image having an increased resolution.


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