The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Dec. 23, 2024
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Shailesh Chandra Jamloki, Noida, IN;

Kiran K. Venkatachala, Bangalore, IN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/27 (2019.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 16/27 (2019.01); G06F 16/2365 (2019.01);
Abstract

A method verifies data integrity in a data replication. Changes to data in a source database are received. The changes are for replication in a target database. A batch of data is created from the changes to the data. A target checksum is determined for the batch of data. Whether the data integrity is present for the batch of data is determined from a comparison of the target checksum with a source checksum for the batch of data. Data in the batch of data is replicated in which the data integrity is present.


Find Patent Forward Citations

Jamloki, Shailesh. (2026). Checksum mechanism for data replication in batches (U.S. Patent No. 12754929). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12754929

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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