The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Dec. 30, 2025
Applicant:

Intuit Inc., Mountain View, CA (US);

Inventors:

Tharathorn Rimchala, San Francisco, CA (US);

Miguel Garcia, San Diego, CA (US);

Preeti Duraipandian, Plano, TX (US);

Sakshi Singla, Mountain View, CA (US);

Sungjae Kim, Plano, TX (US);

Assignee:

Intuit Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/2452 (2019.01); G06F 11/3604 (2025.01); G06F 16/21 (2019.01); G06F 40/40 (2020.01); G06N 3/084 (2023.01);
U.S. Cl.
CPC ...
G06F 11/3608 (2013.01);
Abstract

A method for automatically evaluating code using a dual-capacity machine learning based validation framework. A target code generated by a code generator and ground truth code are received by the validation framework. A large language model is prompted, by the validation framework, with the target code, the ground truth code, and instructions to evaluate the target code by performing operations. The operations include segmenting the target code into a plurality of target code chunks and the ground truth code into a plurality of ground truth code chunks and mapping each target code chunk to corresponding ground truth code chunks. The operations also include evaluating each mapped target code chunk based on the corresponding ground truth code chunk to yield a plurality of scores. The operations also include determining a metric for the target code based on the plurality of scores.


Find Patent Forward Citations

Rimchala, Tharathorn. (2026). Dual-capacity machine learning based validation framework (U.S. Patent No. 12754821). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12754821

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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