The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

May. 25, 2021
Applicant:

Daicel Corporation, Osaka, JP;

Inventors:

Hiroki Oka, Tokyo, JP;

Koichi Yamano, Tokyo, JP;

Hiroharu Matsumoto, Tokyo, JP;

Assignee:

DAICEL CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
G05B 23/0221 (2013.01); G05B 23/0254 (2013.01); G05B 2223/02 (2018.08);
Abstract

An abnormal irregularity cause identifying device includes a process data acquisition unit that reads process data output by sensors included in a production facility performing a batch stage and a continuous stage, a preprocessing unit that associates a range of a complete timing of the batch stage with an output timing of process data of the process data in the continuous stage based on a residence time of the processing target in the production facility, an abnormality determination unit that calculates an abnormality degree by using process data in the batch stage and process data in the continuous stage associated with each other by the preprocessing unit, and a cause diagnosis unit that determines, for each of the process data output by the corresponding one of the plurality of sensors, whether the abnormality degree calculated by the abnormality determination unit satisfies a predetermined criterion.


Find Patent Forward Citations

Oka, Hiroki. (2026). Abnormal irregularity cause identifying device, abnormal irregularity cause identifying method, and abnormal irregularity cause identifying program (U.S. Patent No. 12754541). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12754541

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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