The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2026
Filed:
Nov. 08, 2021
Jfe Steel Corporation, Tokyo, JP;
Hiroyasu Shigemori, Tokyo, JP;
JFE STEEL CORPORATION, Tokyo, JP;
Abstract
A quality abnormality analysis method for a product manufactured by a manufacturing process includes: predicting quality of the product by inputting manufacturing conditions to a quality prediction model generated by using a plurality of manufacturing conditions of the manufacturing process as input variables and using the quality of the product as an output variable; calculating a quality evaluation value of an actual product manufactured by the manufacturing process; calculating, as a quality prediction error, a difference between a quality prediction value obtained as an output and the quality evaluation value; a quality contribution calculation step of quality contribution degrees of the input manufacturing conditions when predicting the quality of the product using the quality prediction model; and presenting, based on the quality prediction error and the quality contribution degree, a manufacturing condition causing a quality abnormality of the product.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile