The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2026
Filed:
Sep. 22, 2023
Applicant:
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Inventors:
Falk Schlaudraff, Butzbach, DE;
Markus Schechter, Frankfurt, DE;
Assignee:
Leica Microsystems CMS GmbH, Wetzlar, DE;
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/24 (2006.01); G02B 21/02 (2006.01);
U.S. Cl.
CPC ...
G02B 21/245 (2013.01); G02B 21/025 (2013.01); G02B 21/241 (2013.01);
Abstract
An apparatus for a microscope system is provided. The apparatus comprising one or more processors and one or more storage devices. The one or more processors are configured to receive region information about an accessible spatial region for an objective of the microscope system and to trigger a restriction of a relative movement of the objective based on the region information.
Schlaudraff, Falk. (2026). Apparatuses for a microscope system, microscope system, methods and computer program (U.S. Patent No. 12754407). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12754407
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile