The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Oct. 03, 2024
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

Keli Sun, Rosenberg, TX (US);

Hui Xie, Sugar Land, TX (US);

Xiaoyan Zhong, Sugar Land, TX (US);

Kong Hauw Sarwa Bakti Tan, Sugar Land, TX (US);

Ettore Mirto, Petaling Jaya, MY;

Kent David Harms, Richmond, TX (US);

Xiao Bo Hong, Sugar Land, TX (US);

Pontus Loviken, Chatillon, FR;

Gordana Draskovic, Bourg-la-Reine, FR;

Thanh Nhan Nguyen, Orsay, FR;

Josselin Kherroubi, Paris, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/38 (2006.01); G01V 1/50 (2006.01); G01V 3/12 (2006.01); G01V 3/18 (2006.01); G01V 3/30 (2006.01); G06N 3/02 (2006.01); G06N 3/08 (2023.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G01V 3/38 (2013.01); G01V 3/30 (2013.01); G01V 1/50 (2013.01); G01V 3/12 (2013.01); G01V 3/18 (2013.01); G06N 3/02 (2013.01); G06N 3/08 (2013.01); G06N 20/00 (2019.01);
Abstract

A method for estimating EM measurement uncertainty includes evaluating EM logging measurements with a trained machine learning model to estimate the measurement uncertainties of the EM logging measurements. The trained machine learning model is trained using a training data set made up of modeled EM logging measurements and corresponding measurement uncertainties.


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