The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Aug. 23, 2022
Applicant:

Shanghai Jiao Tong University, Shanghai, CN;

Inventors:

Zhiyong Zhang, Shanghai, CN;

Hao Chen, Shanghai, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/56 (2006.01); G01R 33/565 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56554 (2013.01);
Abstract

An echo planar imaging method capable of reducing image distortion is provided. Two radio frequency (RF) pulses α and β are used to respectively flip over a longitudinal magnetization into a transverse plane at different moments, so as to obtain observable transverse magnetization; the transverse magnetization obtained by flipping over the longitudinal magnetization by means of α and β are respectively rephased in two different echo trains by means of gradient pulses. Navigator echo signals are respectively collected before the two gradient echo trains, and the amplitude difference between two gradient echo train signals is corrected on the basis of the amplitude difference between the two navigator echo signals. Correcting the signals collected by the two gradient echo trains, so as to obtain two pieces of image data, and the two pieces of image data are averaged to obtain a final image.


Find Patent Forward Citations

Zhang, Zhiyong. (2026). Echo planar imaging method capable of reducing image distortion (U.S. Patent No. 12754272). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12754272

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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