The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Jan. 29, 2025
Applicant:

Microchip Technology Incorporated, Chandler, AZ (US);

Inventor:

Vivek Viswanathan, Chennai, IN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31723 (2013.01); G01R 31/31727 (2013.01); G01R 31/318569 (2013.01);
Abstract

An integrated circuit (IC) for testing an I3C device is provided. The IC may include a start/stop detection logic block to receive a serial data line (SDA) signal and a serial clock line (SCL) signal, and output a start detection signal and a stop detection signal, a SCL counter block to receive the SCL signal and the start and stop detection signals, and output a SCL count value, a SCL positive edge detection signal, and a SCL negative edge detection signal, a SDA inversion logic block to receive the SCL count value, a SCL programmed count value, and the SCL positive and negative edge detection signals, and output a SDA invert enable signal based on a comparison of the SCL count value and the SCL programmed count value, and a multiplexer to receive the SDA invert enable signal, and output the SDA signal or an inverted SDA signal.


Find Patent Forward Citations

Viswanathan, Vivek. (2026). I3c error states test strategy (U.S. Patent No. 12754235). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12754235

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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