The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2026
Filed:
Apr. 12, 2024
The Board of Trustees of the University of Illinois, Urbana, IL (US);
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Abstract
Decoupled optical force nanoscopy allows for measurements of optical forces with nanoscale spatial and temporal resolution. A sample is illuminated with temporally modulated laser light. Optical force data are measured by scanning a cantilever (e.g., of a scanning probe microscope) over the sample to measure optical forces generated by illuminating the sample with the temporally modulated laser light. The optical force data are analyzed in the frequency domain to separate the optical force data into different components, such as photothermal force components, optical gradient force components, photoacoustic force components, and the like.
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