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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12754173 B1

PDFFull Text
Date of Patent:
Oct. 06, 2026

Filed:

Feb. 03, 2023

Monitoring analysis device and monitoring analysis method

Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Yusuke Nagai, Kyoto, JP;

Yosuke Iwata, Kyoto, JP;

Assignee:

SHIMADZU CORPORATION, Kyoto, JP;

Attorney:

Renner, Otto, Boisselle & Sklar, LLP

Primary Examiner:

Samuel P Siefke

Int. Cl.
CPC ...
G01N 30/86 (2006.01); B01D 15/08 (2006.01); G01N 30/14 (2006.01); G01N 30/38 (2006.01); G01N 30/02 (2006.01); G01N 30/06 (2006.01);
U.S. Cl.
CPC ...
G01N 30/8665 (2013.01); B01D 15/08 (2013.01); G01N 30/14 (2013.01); G01N 30/38 (2013.01); G01N 2030/027 (2013.01); G01N 2030/067 (2013.01); G01N 2030/385 (2013.01);
Abstract

A monitoring analysis device includes an acquirer that sequentially acquires reaction products produced by a reactor, an analyzer that sequentially analyzes the reaction products acquired by the acquirer, a pre-processor that performs a pre-process to be performed before an analysis of the reaction products by the analyzer, and a controller that controls the pre-processor such that the pre-process for a second analysis to be performed subsequently to a first analysis is performed during the first analysis by the analyzer.

Find Patent Forward Citations

Nagai, Yusuke. (2026). Monitoring analysis device and monitoring analysis method (U.S. Patent No. 12754173). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12754173

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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