The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2026
Filed:
Mar. 14, 2024
Ishida Co., Ltd., Kyoto, JP;
Kota Tominaga, Ritto, JP;
ISHIDA CO., LTD., Kyoto, JP;
Abstract
An X-ray inspection apparatus includes: a conveying unit; an irradiation unit configured to irradiate an article with an electromagnetic wave; a detection unit configured to detect the electromagnetic wave transmitted through the article; an inspection unit configured to inspect the article; and a determination unit configured to determine attachment of the conveying unit. The conveying unit includes first and second conveying units. The determination unit includes: a support portion attached to the first conveying unit; a swing member swingably attached to the second conveying unit and at least partially in contact with the support portion when the first and second conveying units are attached; and a sensor unit configured to detect whether the swing member is present at a predetermined position in a state where the swing member is in contact with the support portion.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile