The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Jan. 14, 2022
Applicant:

Nec Corporation, Tokyo, JP;

Inventors:

Yusuke Mizukoshi, Tokyo, JP;

Chisato Sugawara, Tokyo, JP;

Toshimichi Yokote, Tokyo, JP;

Yosuke Kimura, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/56 (2022.01); G01N 21/88 (2006.01); G01N 21/956 (2006.01);
U.S. Cl.
CPC ...
G01N 21/8851 (2013.01); G01N 21/95607 (2013.01); G01N 2021/8854 (2013.01); G01N 2021/889 (2013.01);
Abstract

A deterioration estimation system according to an aspect of the present disclosure includes: a memory configured to store instructions; and at least one processor configured to execute the instructions to: detect road surface deterioration from a first road surface image; determine, in the first road surface image, a first region where deterioration is detectable and a second region where deterioration is difficult to detect; calculate a degree of deterioration of the first region based on a detection result from the first road surface image; estimate a degree of deterioration of the second region based on a degree of deterioration in road surface deterioration detected from a second road surface image imaged before the first road surface image; and calculate a degree of deterioration of the road surface based on the calculated degree of deterioration of the first region and the estimated degree of deterioration of the second region.


Find Patent Forward Citations

Mizukoshi, Yusuke. (2026). Deterioration estimation system, deterioration estimation method, and recording medium (U.S. Patent No. 12754141). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12754141

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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