The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Jan. 31, 2023
Applicant:

Gemological Institute of America, Inc. (Gia), Carlsbad, CA (US);

Inventors:

Tsung-Han Tsai, Maywood, NJ (US);

Hiroshi Takahashi, Fort Lee, NJ (US);

Mehdi Toosi, Clifton, NJ (US);

Muhammed Bagdigen, Parsippany, NJ (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/87 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G01N 21/87 (2013.01); G01N 21/17 (2013.01); G01N 2021/1765 (2013.01); G01N 2201/025 (2013.01); G01N 2201/12723 (2013.01);
Abstract

Systems and methods here may be used for automated alignment and focus adjustment for one or multiple sample gemstones on a stage, including determining gemstone sample tilt based on image data, automatically moving a stage to align the tilted sample, determining a focal plane that overlaps a focal point of a camera with the gemstone, and automatically moving a stage to the focal plane.


Find Patent Forward Citations

Tsai, Tsung-Han. (2026). Tilt and focusing adjustment for consistent gem imaging (U.S. Patent No. 12754140). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12754140

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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