The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2026
Filed:
Sep. 16, 2025
Endress+hauser Optical Analysis, Inc., Ann Arbor, MI (US);
Nicholas Skriba, Jackson, MI (US);
Endress+Hauser Optical Analysis, Inc., Ann Arbor, MI (US);
Abstract
Sampling optics for spectroscopic analysis include an array of optical elements as opposed to a single objective as used in conventional systems, achieving enhanced collection, inherent signal integration/averaging and improved measurement uniformity. At the same time, the etendue using the array is substantially the same as the etendue using a single-element objective. The array of closely packed optical elements may have spherical or aspherical surfaces and may be transmissive or reflective. An array of lenses and reflective elements may be arranged together in flow cell configurations and/or for signal amplification involving multiple passes through a sample medium. The array elements may be arranged in hexagonal, linear, radial or other packing geometries and may be implemented as a flat or curved panel. The present disclosure is applicable to remote fiber probes and flow cell geometries to measure solids, liquids, gasses and semi-liquid such as slurries.
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