The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Feb. 14, 2024
Applicant:

Hüttlin Gmbh, Schopfheim, DE;

Inventors:

Marc Michaelis, Lörrach, DE;

Christian Karl Paasche, Bad Säckingen, DE;

Stefan Manz, Bissingen an der Teck, DE;

Assignee:

Hüttlin GmbH, Schopfheim, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G01M 99/005 (2013.01);
Abstract

A method and apparatus () for recognizing a fault state of a machine () or of a process is disclosed. The apparatus () is configured to detect actual values of parameters of the process at the machine () for carrying out the process. The parameters include at least one controllable process parameter () of the process, at least one non-controllable process parameter () of the process or at least one control parameter () for controlling the or another controllable process parameter () in the process. The apparatus () is configured to predefine a target correlation for actual values of at least two of the parameters, to determine an actual correlation depending on the actual values of the at least two of the parameters, and to recognize a fault state of the machine () or of the process depending on the actual correlation and the target correlation.


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Michaelis, Marc. (2026). Method and apparatus for recognizing a fault state of a machine or of a process (U.S. Patent No. 12754105). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12754105

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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