The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Aug. 06, 2024
Applicant:

Dai Nippon Printing Co., Ltd., Tokyo, JP;

Inventors:

Shinsuke Nakazawa, Tokyo, JP;

Takeshi Toda, Tokyo, JP;

Naoya Oda, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 5/347 (2006.01); G01B 11/02 (2006.01); G01D 5/244 (2006.01); G02B 5/08 (2006.01);
U.S. Cl.
CPC ...
G01D 5/34707 (2013.01); G01D 5/24438 (2013.01); G01D 5/3473 (2013.01); G01D 5/34746 (2013.01); G02B 5/085 (2013.01); G01B 11/02 (2013.01);
Abstract

A main object of the present disclosure is to provide a reflection-type optical encoder scale capable of sufficiently reducing the reflectance on a low reflection region. The present disclosure achieves the object by providing a reflection-type optical encoder scale comprising: a high reflection region and a low reflection region alternately placed on a transparent substrate, wherein the low reflection region includes a low reflection portion including at least three stacked inorganic layers, and a reflectance on the low reflection region is 5% or less, wherein the high reflection region includes at least one stacked inorganic layer, and a reflectance on the high reflection region is 60% or more, and wherein a value of a ratio S/N represented by the following formula (3) is 6 or more, (3) the ratio S/N=the reflectance on the high reflection region/the reflectance on the low reflection region.


Find Patent Forward Citations

Nakazawa, Shinsuke. (2026). Reflection-type optical encoder scale including an inorganic layer stack pattern with specific reflectance (U.S. Patent No. 12754044). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12754044

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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