The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Apr. 22, 2024
Applicant:

Here Global B.v., Eindhoven, NL;

Inventors:

Andrei Dmitriev, Berlin, DE;

Onur Derin, Eindhoven, NL;

Jérôme Beaurepaire, Courbevoie, FR;

Oleksandr Kondrashov, Berlin, DE;

Rafiullah Mohammed, Whiting, IN (US);

Assignee:

HERE GLOBAL B.V, Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 21/00 (2006.01); G06F 40/20 (2020.01);
U.S. Cl.
CPC ...
G01C 21/3856 (2020.08); G01C 21/3848 (2020.08); G06F 40/20 (2020.01);
Abstract

An approach is provided for large language model (LLM) map feedback reporting. The approach involves, for example, processing an input specifying a map error/feedback using an LLM to classify a map error type. The approach also comprises determining a map error template based on the map error type that specifies structured data fields for the map error type. The approach further involves using the template to construct prompts for the LLM to generate questions to collect data items for populating the data fields, and providing the prompts to the LLM to generate the questions and collect the data items from the user. The approach further involves using template to generate additional prompts to generate a map error report of the data items in a structured data format, and providing the additional prompts to the LLM to generate the map error report for transmission to a map feedback system.


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