The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Apr. 30, 2024
Applicant:

Industrial Technology Research Institute, Hsinchu, TW;

Inventors:

Chin-Chia Chang, Tainan City, TW;

Chia-Ming Tsai, Tainan City, TW;

Yi-Tong Liu, New Taipei City, TW;

Chien-Hsun Wu, Tainan City, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/00 (2006.01); G01B 11/22 (2006.01);
U.S. Cl.
CPC ...
G01B 5/0025 (2013.01); G01B 11/22 (2013.01);
Abstract

A wheel blank inspection device is for inspecting a wheel blank and includes a depth sensor and a computing control module electrically connected to the depth sensor. The computing control module executes a path acquisition process, a depth measurement process and a load point localization process. The path acquisition process is controlling the depth sensor to scan the wheel blank, obtaining a center fitted to a flange of the wheel blank, and calculating at least one detection path based on the center. The depth measurement process is controlling the depth sensor to scan the flange of the wheel blank according to the at least one detection path to capture depth values of the flange. The load point localization process is obtaining load points and information of relative positions of the load points with respect to a reference point of the wheel blank based on the depth values.


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