The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Mar. 13, 2024
Applicant:

Fanuc America Corporation, Rochester Hills, MI (US);

Inventors:

Xin Hu, Ann Arbor, MI (US);

Yi Sun, Bloomfield Hills, MI (US);

Claude Dinsmoor, Rochester Hills, MI (US);

Rick Wunderlich, Canton, MI (US);

Assignee:

FANUC America Corporation, Rochester Hills, MI (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B25J 13/08 (2006.01); B25J 9/16 (2006.01); G06F 18/23213 (2023.01); G06F 18/2433 (2023.01);
U.S. Cl.
CPC ...
B25J 9/1653 (2013.01); B25J 9/1674 (2013.01); B25J 13/085 (2013.01); G06F 18/23213 (2023.01);
Abstract

A method and system for analyzing robot data to identify anomalies. Data from robot production operations are provided to a processor running a K-means clustering algorithm which separates the data into a number (K) of clusters. The K-means clustering algorithm is executed two or more times on the data, each time using a different value of K within a predefined range. A scoring technique is used to determine an optimal value for the number of clusters K, where the score is calculated in a computation which rewards small distances between points within a cluster and large distances between points in different clusters. The K-means clustering results for the optimal value of K are used to separate the data by cluster, whereupon the separated data is analyzed to identify trends in the parameter data. One of the clusters may contain outlier data points, some of which may indicate an anomaly condition.


Find Patent Forward Citations

Hu, Xin. (2026). Industrial robot production data clustering for anomaly prediction (U.S. Patent No. 12752422). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12752422

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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