The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

May. 03, 2024
Applicant:

Reflexion Medical, Inc., Hayward, CA (US);

Inventors:

Amir Ramezanzadeh Moghadam, San Jose, CA (US);

Thomas Leroy Laurence, Jr., Benicia, CA (US);

David Quentin Larkin, Menlo Park, CA (US);

Assignee:

RefleXion Medical, Inc., Hayward, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61N 5/10 (2006.01);
U.S. Cl.
CPC ...
A61N 5/1071 (2013.01); A61N 5/1081 (2013.01);
Abstract

Disclosed herein are systems and methods for measuring the radiation emitted from the therapeutic radiation source. One variation of a radiotherapy system includes a radiation measurement device that is coupled to a radiotherapy system housing. The radiation measurement device may be movably coupled to the housing, and its position and/or motion is independent from the position and/or motion of the therapeutic radiation source. In one variation, the radiation measurement device is at a location on the system housing where it may measure exit beams with little or no interference with entrance beams. Also disclosed herein are radiotherapy systems that include one or more radiopaque or radiation emitting fiducials coupled to the housing.


Find Patent Forward Citations

Ramezanzadeh Moghadam, Amir. (2026). Radiotherapy systems and methods for quality assurance and calibration (U.S. Patent No. 12752131). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12752131

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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