The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 2026
Filed:
Dec. 20, 2022
Applicant:
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Inventor:
George Themelis, Singapore, SG;
Assignee:
Leica Instruments (Singapore) Pte Ltd., Singapore, SG;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 90/20 (2016.01); A61B 34/20 (2016.01);
U.S. Cl.
CPC ...
A61B 90/20 (2016.02); A61B 34/20 (2016.02); A61B 2034/2055 (2016.02);
Abstract
Examples relate to a system, method, and computer program for a surgical microscope system, and to a corresponding surgical microscope system. The system is configured to determine a depth characteristic of a surgical site being imaged using a microscope. The system is configured to adjust a numerical aperture of the microscope based on the depth characteristic of at least a portion of the surgical site.
Themelis, George. (2026). System, method, and computer program for a surgical microscope system and corresponding surgical microscope system (U.S. Patent No. 12751790). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12751790
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile