The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Jun. 05, 2023
Applicant:

Ablaview, S.l., Madrid, ES;

Inventors:

Juan Sancho, Madrid, ES;

David Herranz, Alpedrete, ES;

Christophe Bailleul, Paris, FR;

James Greene, Shelfield Green, GB;

Assignee:

Ablaview, S.L., Madrid, ES;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 18/14 (2006.01); A61B 90/00 (2016.01);
U.S. Cl.
CPC ...
A61B 90/06 (2016.02); A61B 18/1492 (2013.01); A61B 2090/061 (2016.02);
Abstract

Described herein are systems, methods for detecting gaps between lesions formed in tissue during ablation. A system includes a catheter that has proximal section, a distal section, and a shaft coupled between the proximal section and the distal section. A plurality of optical fibers are located within the catheter and are coupled to a computing device. The computing device includes a memory and a processor configured to receive, from the optical fibers, optical measurement data of a portion of tissue during or after an ablation, identify one or more optical properties of the portion of tissue by analyzing the optical measurement data, and detect a presence or an absence of a gap between one or more lesions formed in the portion of tissue based on the one or more optical properties.


Find Patent Forward Citations

Sancho, Juan. (2026). Systems and methods for gap detection during ablation (U.S. Patent No. 12751789). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12751789

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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