The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 2026

Filed:

Oct. 28, 2024
Applicant:

Siemens Healthineers Ag, Forchheim, DE;

Inventors:

Benjamin Schweikert, Gutenstetten, DE;

Bjoern Kreisler, Hausen, DE;

Assignee:

SIEMENS HEALTHINEERS AG, Forchheim, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2024.01); A61B 6/42 (2024.01); G01T 1/17 (2006.01);
U.S. Cl.
CPC ...
A61B 6/542 (2013.01); A61B 6/4241 (2013.01); A61B 6/5205 (2013.01); G01T 1/17 (2013.01);
Abstract

A computer-implemented method comprises: capturing spatially resolved dose profiles for an x-ray imaging scan of at least one examination object in accordance with initial recording parameters via a photon-counting x-ray detector, wherein each photon-counting detector element provides a dose value depending on a number of detected x-ray photons after an interaction between x-ray radiation and the at least one examination object, and wherein the dose profiles are formed by the dose values of the detector elements of each of one or more x-ray imaging scans; and provisioning adjusted recording parameters by applying a trained function to input data, wherein the input data is based on the initial recording parameters and the dose profiles, and the trained function is based on a dose-aware signal quality metric.


Find Patent Forward Citations

Schweikert, Benjamin. (2026). Providing adjusted recording parameters (U.S. Patent No. 12751684). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12751684

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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